Stephen Sunter graduated from the University of Waterloo in 1978 with a Bachelor of Applied Science in electrical engineering.  He worked in mixed-signal IC design from 1977 to 1990 at Bell-Northern Research and Nortel, in Canada.  Then he moved to Australia to develop digital DFT and ATPG solutions at GEC-Plessey Telecommunications from 1990 to 1992, returning afterwards to Ottawa to manage mixed-signal test engineering at Nortel until 1995.  In 1996 (many years before Nortel’s demise), he became engineering director of mixed-signal DFT at LogicVision, which was acquired by Mentor Graphics in 2009, where he continues to hold that position.  In addition to 26 U.S. patents, Steve has published over 40 journal/conference papers on mixed-signal DFT/BIST topics, three of which won Best Paper or Honorable Mention awards.  He has contributed chapters to four books about mixed-signal DFT and BIST, one of which was described in an IEEE Design & Test review as, “a model of how a tutorial chapter should be written.”  He has presented over a dozen tutorials, to audiences of 20~120, each lasting between an hour and a day, and written articles in magazines such as EDN, Evaluation Engineering, and Computer Design.  He is an active member of the Working Groups for the IEEE mixed-signal DFT-related standards: 1149.4, 1149.6, 1149.8.1, and P1149.10.  He has served on the Program Committees of ITC and VTS for over 15 years, the Program Committees for TTEP and DATE for 5 years, and thrice as Program Chair/Co-Chair for the International Mixed Signals Testing Workshop (IMSTW).