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Tutorial
May 15th

Conference Day
May 16th

Location : (Wyndham Gardens, Austin TX)

Data-Mining for Yield and Debug

Teachers - Jeanie OLeary (NXP)

Description -  This free class will focus on production data analytics and collection to improve yield learning and debug. Practical how to use approach from industry experts on the benefits, types of data, collection methods, and analytics such as AI and machine learning.

9:00 - 9:30am On site Registration (coffee provided)

  • Introductions and Agenda
LUNCH - Free lunch
  • Q&A

~3pm - Class ends

 

 

Location : (Wyndham Gardens, Austin TX)

AGENDA
8:00 - 8:30 On Site Registration (coffee provided)

8:30 - 8:35 Welcomes and introductions

8:35 - 9:10 Key Note Address
Chris Collins

Senior VP of Product and

Technology Enablement

NXP Corporation

click for Presentation


Session 1
9:10 - 9:50 - Presentation 1 - Terry Duepner
(NI Corp)
       
Title - Moving DFT up the Design Hierarchy
9:50 - 10:30 - Presentation 2 -
K.King,A.Pandey (Amazon)
        Title - How Amazon Designs Chips on AWS
10:30 - 11:00     B R E A K
11:00 12:00 Presentation 3 - Technology Spotlights
                  Mentor Graphics - 20 min  
                  Synopsys - 20 min

                  SiliconAid - 20 min


12:00 - 1:00    LUNCH - Free lunch

Session 2
1:00 1:40 - Presentation 4 - Carol Pyron (NXP)
         
Title - Smart Design for Yield Arch & Trade-offs
1:40 2:20 - Presentation 5 - Adam Cron & Al Crouch
         
Title - IEEE P1838 Standard for 3DIC Test
2:20 3:00 - Presentation 6 - Frank Frederick (ARM)
         Title - A Practical Application of IEEE 1838
3:00 - 3:30     B R E A K
Session 3
3:30 4:10 - Presentation 7 - Grady Giles  (AMD)
          
Title - DFT tricks to make latches ATPG-Ready
4:10 4:50 - Presentation 8 - Teresa McLaurin (ARM)
          
Title -
DFT Signals & Safety for Automotive

5:00 - 6:00 - Panel Discussion Referee: Jim Johnson
5:00 - 6:00   Happy Hour during Panel

 
 

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