![]() |
![]() |
![]() |
|
![]() |
|
![]() |
|
![]() |
|
![]() |
![]() |
If you attended the
conference, PLEASE take just
ONE MINUTE to fill out our small survey
to help make this event next year even better!
CLICK HERE for the 2019 survey! If the presenter has given approval, presentations are be posted on this page (BELOW). We will possibly add more presentation until June 10th. Recheck later if you don't see the presentation you want. |
Tutorial
|
Conference Day |
Location : (Wyndham Gardens, Austin TX)Data-Mining for Yield and Debug Teachers - Jeanie OLeary (NXP)Description - This free class will focus on production data analytics and collection to improve yield learning and debug. Practical how to use approach from industry experts on the benefits, types of data, collection methods, and analytics such as AI and machine learning.9:00 - 9:30am On site Registration (coffee provided)
~3 pm - Class ends
|
Location : (Wyndham Gardens, Austin TX)
AGENDA
8:35 - 9:10 Key Note Address
Senior VP of Product and
Technology Enablement
NXP Corporation
Session 1
Title - How Amazon Designs Chips on AWS 10:30 - 11:00 B R E A K 11:00 – 12:00 – Presentation 3 - Technology Spotlights Mentor Graphics - 20 min Synopsys - 20 min SiliconAid - 20 min 12:00 - 1:00 LUNCH - Free lunch Session 2 1:00 – 1:40 - Presentation 4 - Carol Pyron (NXP) Title - Smart Design for Yield Arch & Trade-offs 1:40 – 2:20 - Presentation 5 - Adam Cron (Synopsys) Title - IEEE P1838 Standard for 3DIC Test 2:20 – 3:00 - Presentation 6 - Frank Frederick (ARM) Title - A Practical Application of IEEE 1838 3:00 - 3:30 B R E A K Session 3 3:30 – 4:10 - Presentation 7 - Grady Giles (AMD) Title - DFT tricks to make latches ATPG-Ready 4:10 – 4:50 - Presentation 8 - Teresa McLaurin (ARM) Title - DFT Signals & Safety for Automotive 5:00 - 6:00 - Panel Discussion Referee: Jim Johnson 5:00 - 6:00 Happy Hour during Panel |
© 2001-Present : SiliconAid Solutions Email
Us