Open Technical Day (May
25th, 2006)
(Presentation which are approved to be
released have links - Check back for additional releases)
8:30 - 9:10 Key Note Address –
Ken Butler : Texas Instruments
Session 1 – Yield Impacts of DFT Chair: Jay Bedsole
9:10 - 9:40 - Andy Hughes (Cadence) Yield Diagnostics
9:40 - 10:10 - Greg Yeric (Synopsys) Yield Analysis
10:10 - 10:45 B R E A K
10:45 - 11:15 -
Carl Barnhart (SiAid) JTAG flavors
Session 2 – DFM
Chair: Al Crouch
11:15 - 11:45 - Al Crouch - Data Collection for Yield
11:45 - 1:30 LUNCH -
Free lunch sponsored by SiliconAid
1:30 - 2:00 - Raj Raina (Freescale) - Challenges in 65ns
2:00 - 2:30 -
David Eppes (AMD) - SRAM FA and Debug
2:30 - 3:00 B R E A K
Session 3 – DFT and Debug
Chair: Andy Halliday
3:00 - 3:30 - Jayant D'Souza (Mentor) - At speed testing
3:30 - 4:00 -
Jason Doege
(DA-Test) - Fixing Transition Delay
4:00 - 4:30 - Abhijit Jas (Intel) - Minimizing Functional Constraints
4:30 - 5:30 - Panel
Discussion Referee: Jim Johnson
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