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Conference Day
May 2^nd

Tutorial
May 1^st

Location : Norris Conference Center (2525 West Anderson Ln)

AGENDA
8:00 - 8:30 On Site Registration (coffee provided)
8:30 - 8:35 Welcomes and introductions
8:35 - 9:10 Key Note Address

Dave Fick
Founder and CTO
Mythic AI

Title - AI's Impact on Chips

Session 1
9:10 - 9:50 - Presentation 1 - Grady Giles (AMD)
                  Title - Embedded Core Wrappers Revisted
9:50 - 10:30 - Presentation 2 - Jim Johnson
                  Title - Is IJTAG a Security Issue?
10:30 - 11:00     B R E A K
11:00 – 11:40 – Presentation 3 - Technology Spotlights
                  Mentor Graphics - 20 min
                  SiliconAid - 20 min

11:40 - 1:00    LUNCH - Free lunch

Special Speaker
1:00 – 1:40 - Presentation 4 - Fawzi Behmann (TelNet)
                  Title - Vision of IoT and 5G by 2020
Session 2
1:40 – 2:20 - Presentation 5 - Al Crouch (Amida)
                  Title - Data Analysis of Trojan Circuits
2:20 – 3:00 - Presentation 6 - Joel Irby (ARM)
                  Title - What DFT Engineers do in Research
3:00 - 3:30     B R E A K
Session 3
3:30 – 4:10 - Presentation 7 - Sankaran Menon (Intel)
                  Title - SOC Debug using USB Type-C
4:10 – 4:50 - Presentation 8 - (Hunt Pennington Kumar & Dula)
                  Title - IP and Issues Affecting You!
5:00 - 6:00 - Panel Discussion Referee: Jim Johnson
5:00 - 6:00   Happy Hour during Panel

Location : Norris Conference Center (2525 West Anderson Ln)

Interconnected IEEE Standards

Teachers - Adam Cron (Synopsys), Etienne Racine (Mentor)

There has been a continuous development trend of IEEE Test Standards addressing access to DFT resources inside evolving packaged electronics. This tutorial will address the most popular test access standards and the most salient aspects of each. These include IEEE Stds 1149.1 (package/board connection and beyond) , 1687 (instrument access through 1149.1), 1500 (core wrapping), and P1838 (3DIC test access). These standards can interact with each other and may rely on other IEEE standards to support automated construction, and design and use methodologies which will be addressed by the authors.

9:00 - 9:30am On site Registration (coffee provided)

Introductions and Agenda

LUNCH - Free lunch

Q&A

~3pm - Class ends

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Conference Day May 2^nd	Tutorial May 1^st
Location : Norris Conference Center (2525 West Anderson Ln) AGENDA 8:00 - 8:30 On Site Registration (coffee provided) 8:30 - 8:35 Welcomes and introductions 8:35 - 9:10 Key Note Address Dave Fick Founder and CTO Mythic AI Title - AI's Impact on Chips Session 1 9:10 - 9:50 - Presentation 1 - Grady Giles (AMD) Title - Embedded Core Wrappers Revisted 9:50 - 10:30 - Presentation 2 - Jim Johnson Title - Is IJTAG a Security Issue? 10:30 - 11:00 B R E A K 11:00 – 11:40 – Presentation 3 - Technology Spotlights Mentor Graphics - 20 min SiliconAid - 20 min 11:40 - 1:00 LUNCH - Free lunch Special Speaker 1:00 – 1:40 - Presentation 4 - Fawzi Behmann (TelNet) Title - Vision of IoT and 5G by 2020 Session 2 1:40 – 2:20 - Presentation 5 - Al Crouch (Amida) Title - Data Analysis of Trojan Circuits 2:20 – 3:00 - Presentation 6 - Joel Irby (ARM) Title - What DFT Engineers do in Research 3:00 - 3:30 B R E A K Session 3 3:30 – 4:10 - Presentation 7 - Sankaran Menon (Intel) Title - SOC Debug using USB Type-C 4:10 – 4:50 - Presentation 8 - (Hunt Pennington Kumar & Dula) Title - IP and Issues Affecting You! 5:00 - 6:00 - Panel Discussion Referee: Jim Johnson 5:00 - 6:00 Happy Hour during Panel	Location : Norris Conference Center (2525 West Anderson Ln) Interconnected IEEE Standards Teachers - Adam Cron (Synopsys), Etienne Racine (Mentor) There has been a continuous development trend of IEEE Test Standards addressing access to DFT resources inside evolving packaged electronics. This tutorial will address the most popular test access standards and the most salient aspects of each. These include IEEE Stds 1149.1 (package/board connection and beyond) , 1687 (instrument access through 1149.1), 1500 (core wrapping), and P1838 (3DIC test access). These standards can interact with each other and may rely on other IEEE standards to support automated construction, and design and use methodologies which will be addressed by the authors. 9:00 - 9:30am On site Registration (coffee provided) Introductions and Agenda LUNCH - Free lunch Q&A ~3pm - Class ends