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Conference Day
May 5^th

Tutorial
May 4^th

Location : Austin Crown Plaza Hotel (I35 & 290)

AGENDA
8:00 - 8:30 On Site Registration (coffee provided)
8:30 - 8:35 Welcomes and introductions
8:35 - 9:10 Key Note Address

Ken Hansen

President and CEO
Semiconductor Research Corporation

(Click here for Key Note Presentation)

Session 1
9:10 - 9:50 - Presentation 1 - Stephen McGinty (NXP)
                  Title - Origen - New Test Generation Software
9:50 - 10:30 - Presentation 2 - Terry Duepner (National Inst)
                  Title - Board Test Using JTAG Techniques
10:30 - 11:00     B R E A K
11:00 – 12:15 – Presentation 3 - Technology Spotlights
                  Cadence - 20 min
                  Mentor Graphics - 20 min
                  Optimal - 20 min
                  SiliconAid - 15 min

12:15 - 1:35    LUNCH - Free lunch

Session 2
1:35 – 2:15 - Presentation 4 - Ken Butler (TI)
                  Title - 12 Years of Test Data Analytics
2:15 – 2:55 - Presentation 5 - Bert Gab (Cisco)
                  Title - End to End Adaptive Test : System to Component
2:55 - 3:30     B R E A K
Session 3
3:30 – 4:10 - Presentation 6 - Mark LaVine (ARM)
                  Title - Silicon Debug Challenges for Hardware
4:10 – 4:50 - Presentation 7 - Keith Witek (Tesla)
                  Title - Industry Status and Outlook
5:00 - 6:00 - Panel Discussion Referee: Jim Johnson
5:00 - 6:00   Happy Hour during Panel

Location : Norris Conference Center (back of North Cross Mall -
                                                           2525 W. Anderson Lane)


IC Chip Security and IEEE P1838 (3D)

9:00 - 9:30am On site Registration (coffee provided)

Introductions and Agenda

Session 1 - Hardware Security - Keeping bad guys out!
Teacher - Prof. Jennifer Dworak (SMU)

LUNCH - Free lunch by SiliconAid

Session 2 - P1838 - Standardizing the 3D IC space
Teachers - Teresa McLaurin (ARM), Al Crouch (SiliconAid)

~3:30pm - Class ends

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Conference Day May 5^th	Tutorial May 4^th
Location : Austin Crown Plaza Hotel (I35 & 290) AGENDA 8:00 - 8:30 On Site Registration (coffee provided) 8:30 - 8:35 Welcomes and introductions 8:35 - 9:10 Key Note Address Ken Hansen President and CEO Semiconductor Research Corporation (Click here for Key Note Presentation) Session 1 9:10 - 9:50 - Presentation 1 - Stephen McGinty (NXP) Title - Origen - New Test Generation Software 9:50 - 10:30 - Presentation 2 - Terry Duepner (National Inst) Title - Board Test Using JTAG Techniques 10:30 - 11:00 B R E A K 11:00 – 12:15 – Presentation 3 - Technology Spotlights Cadence - 20 min Mentor Graphics - 20 min Optimal - 20 min SiliconAid - 15 min 12:15 - 1:35 LUNCH - Free lunch Session 2 1:35 – 2:15 - Presentation 4 - Ken Butler (TI) Title - 12 Years of Test Data Analytics 2:15 – 2:55 - Presentation 5 - Bert Gab (Cisco) Title - End to End Adaptive Test : System to Component 2:55 - 3:30 B R E A K Session 3 3:30 – 4:10 - Presentation 6 - Mark LaVine (ARM) Title - Silicon Debug Challenges for Hardware 4:10 – 4:50 - Presentation 7 - Keith Witek (Tesla) Title - Industry Status and Outlook 5:00 - 6:00 - Panel Discussion Referee: Jim Johnson 5:00 - 6:00 Happy Hour during Panel	Location : Norris Conference Center (back of North Cross Mall - 2525 W. Anderson Lane) IC Chip Security and IEEE P1838 (3D) 9:00 - 9:30am On site Registration (coffee provided) Introductions and Agenda Session 1 - Hardware Security - Keeping bad guys out! Teacher - Prof. Jennifer Dworak (SMU) LUNCH - Free lunch by SiliconAid Session 2 - P1838 - Standardizing the 3D IC space Teachers - Teresa McLaurin (ARM), Al Crouch (SiliconAid) ~3:30pm - Class ends