SiliconAid Solutions, INC.

May 5^th, 2010 - Tutorial

Future Challenges in DFT & Test
S.Sunter - Mentor Graphics      Mixed Signal DFT
T.McLaurin - ARM                     Multi-Core DFT
A.Crouch - ASSET-InterTech    3D Die Stack DFM

May 6^th, 2010 - Conference Day
8:00 - 8:30 On site Registration (coffee provided)
8:30 - 8:40 Welcomes and introductions
8:40 - 9:10 Key Note Address – Mike Lydon (Cisco Systems VP) (not for distribution)
Session 1
9:10 - 9:50 - Presentation 1 - Steve Comen (Texas Instruments)
                  Title – Adaptive Test Efforts
9:50 - 10:30 - Presentation 2 - Jennifer Dworak - (Brown Univ.)
                  Title – Online Monitors Correlate to Functional Tests
10:30 - 11:10 B R E A K
11:10 – 12:10 – Sponsor Presentations - (20 min each)
                 Title –Mentor Graphics, Asset InterTech
12:10 - 1:30 LUNCH - Free lunch
Session 2
1:30 – 2:10 - Presentation 4 – Mahmut Yilmaz (AMD)
                  Title – Scan DFT Features for latest uP Core (not for distribution)
2:10– 2:50 - Presentation 5 - Carol Pyron (Freescale)
                  Title – IEEE 1149.6 and new dot 1 changes
2:50 - 3:30 - Presentation 6 - Bill Eklow (Cisco)
                  Title – Too Much XRAY May Result in Memory Loss!
3:30 - 4:10 B R E A K

Session 3
4:10 – 4:50 - Presentation 7 - Debo Sekoni (AltaSen)
                  Title – Talus Design with Scan Compression
4:50 – 5:30 - Presentation 8 – Eric Collins (Montage Technology
                  Title – Industry Outlook - A Model for Innovation
5:30 - 6:30 - Panel Discussion              Referee: Jim Johnson
5:30 - 6:30 Happy Hour during Panel